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TECHNICAL
LED Lamps
Test Item
Test Conditions
Description
Reference
Standard
Continuous operating
Ta=25°C T=1000hrs
The purpose of this test is to determine the resistance of the
device when operating under electrical stress
EIAJ ED-4701 100 101
RH=75%RH, IF(Max)
High temperature storage
Ta=100°C T=1000hrs
The purpose of this test is to evaluate the product durability
after long-term storage in high temperature
EIAJ ED-4701 200 201
Low temperature storage
Ta=-40°C T=1000hrs
The purpose of this test is to evaluate the product durability
after long-term storage in low temperature
EIAJ ED-4701 200 202
High temperature and
humidity storage
Ta=60°C T=1000hrs
The purpose of this test is to evaluate product durability
under long-term high temperature and high humidity storage
EIAJ ED-4701 100 103
RH=90%RH
High temperature and
humidity operating
Ta=60°C T=1000hrs
The purpose of this test is to determine the resistance of the
device under electrical and thermal stress
EIAJ ED-4701 100 102
RH=90%RH, IF(Max)
Lead frame bending
Bend 90°C T=3 cycles
The purpose of this test is to evaluate products durability
against mechanical stress applied to leads
N/A
Lead frame pulling
W=1kg T=30sec
The purpose of this test is to evaluate products durability
against mechanical stress
N/A
Solderability
Ta=245°C T=5sec
The purpose of this test is to evaluate solderability on leads
of device
EIAJ ED-4701 300 303
Soldering resistance
Ta=260°C T=10sec
The purpose of this test is to determine the thermal resistance
characteristics of the device to sudden exposures at extreme
changes in temperature during Tin-dipping
EIAJ ED-4701 300 302
Temperature cycling
Ta=-40°C~25°C~100°C~25°C
The purpose of this test is to determine the resistance of the
device to storage under extreme temperature for hours
EIAJ ED-4701 100 105
T=(30min~5min~30min~5min)×10cycles
Temperature cycling
operating
Ta=-40°C~25°C~100°C~25°C IF(Max)
The purpose of this test is to determine the resistance of the
device under extreme temperature for hours
N/A
T=(30min~5min~30min~5min)×10cycles
Thermal shock
Ta=0°C~100°C
The purpose of this test is to determine the resistance of
the device to sudden extreme changes in high and low
temperature
EIAJ ED-4701 300 307
T=5min~5min×100cycles
RELIABILITY TESTS
RELIABILITY TESTS